Performance Comparison of Different Fin Shapes of FinFET
Author : Subham Banerjee, Arun Kumar Ray, Santanu Mondal, Rakesh Kumar, Sushanta Mahanty
Pages : 9
Intelligent Quality Control in Manufacturing Using Integrated Statistical Process Control and Machine Learning
Author : Sourav Prakash Naik, Dr. Shridhar Mhalsekar
Pages : 12
AI-Based Risk Management and Progress Tracking System
Author : Sidhant Janardhan Naik, Dr. Milind Sakhardande
Pages : 11
A Reconfigurable SRAM-Based PUF Architecture for Robust and Lightweight Device Authentication
Author : Advait Phadke, Dr. Deepti Khurge, Darshan Tayade, Omkar Wadhavankar
Pages : 10
Integrative In Silico Repurposing of Kinase Inhibitors for Gastric Cancer using a Multi-Target Precision Medicine Strategy
Author : Insha Rizwan, Dr. Prakash Chandra
Pages : 14
